6704 search results - page 123 / 1341 » Testing Scenario-Based Models |
103
Voted
VTS
2002
IEEE
15 years 7 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
125
Voted
VTS
1997
IEEE
15 years 6 months ago
1997
IEEE
We describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. Wepropos...
129
Voted
ANSOFT
2002
15 years 2 months ago
2002
Abstract. Current practice in Web application development is based on the skills of the individual programmers and often does not apply the principles of software engineering. The ...
111
Voted
ICNSC
2007
IEEE
15 years 9 months ago
2007
IEEE
—A whole calibration test process of Stewart platform including the error analysis, calibration model, measure process, data analysis, parameter errors determination and the iter...
118
Voted
ISSTA
2006
ACM
15 years 8 months ago
2006
ACM
Software product line modeling has received a great deal of attention for its potential in fostering reuse of software artifacts across development phases. Research on the testing...