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TGC
2005
Springer
15 years 8 months ago
Model-Based Testing of Cryptographic Protocols
Dean Rosenzweig, Davor Runje, Wolfram Schulte
95
Voted
ICSE
2009
IEEE-ACM
15 years 7 months ago
The Automated Generation of Test Cases Using an Extended Domain Based Reliability Model
Alberto Avritzer, Elaine J. Weyuker
59
Voted
GLVLSI
1999
IEEE
85views VLSI» more  GLVLSI 1999»
15 years 6 months ago
On Applying Set Covering Models to Test Set Compaction
Paulo F. Flores, Horácio C. Neto, Joã...
ESEC
1999
Springer
15 years 6 months ago
Using Model Checking to Generate Tests from Requirements Specifications
Angelo Gargantini, Constance L. Heitmeyer
ICSM
1998
IEEE
15 years 6 months ago
Dynamic Model for Maintenance and Testing Effort
F. Calzolari, Paolo Tonella, Giuliano Antoniol