2672 search results - page 24 / 535 » Testing Self-Similar Networks |
IJIS
2002
14 years 9 months ago
2002
IWOCA
2010
Springer
14 years 4 months ago
2010
Springer
JNIT
2010
14 years 4 months ago
2010
ITC
1989
IEEE
15 years 1 months ago
1989
IEEE
: The concept of a pseudo-exhaustive test for sequential circuits is introduced in a similar way as it is used for combinational networks. Instead of test sets one has to apply pse...
SBCCI
2004
ACM
15 years 3 months ago
2004
ACM
This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores...