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» Testing Semantics: Connecting Processes and Process Logics
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121
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ASPDAC
2001
ACM
82views Hardware» more  ASPDAC 2001»
15 years 8 months ago
Towards the logic defect diagnosis for partial-scan designs
Loical defect diagnosis is a critical yet challenging process in VLSI manufacturing. It involves the identification of the defect spots in a logic IC that fails testing. In the la...
Shi-Yu Huang
ITSSA
2006
116views more  ITSSA 2006»
15 years 4 months ago
A Genetic Programming Approach to Automated Test Generation for Object-Oriented Software
: This article proposes a new method for creating test software for object-oriented systems using a genetic programming approach. It is believed that this approach is advantageous ...
Arjan Seesing, Hans-Gerhard Groß
139
Voted
ACL
1998
15 years 6 months ago
A Test Environment for Natural Language Understanding Systems
The Natural Language Understanding Engine Test Environment (ETE) is a GUI software tool that aids in the development and maintenance of large, modular, natural language understand...
Li Li, Deborah A. Dahl, Lewis M. Norton, Marcia C....
WISES
2003
15 years 6 months ago
Built-In Fault Injectors - The Logical Continuation of BIST?
— With the increasing number of embedded computer systems being used in safety critical applications the testing and assessment of a system’s fault tolerance properties become ...
Andreas Steininger, Babak Rahbaran, Thomas Handl
CCS
2011
ACM
14 years 4 months ago
Trace equivalence decision: negative tests and non-determinism
We consider security properties of cryptographic protocols that can be modeled using the notion of trace equivalence. The notion of equivalence is crucial when specifying privacy-...
Vincent Cheval, Hubert Comon-Lundh, Stéphan...