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TCAD
2010
102views more  TCAD 2010»
14 years 4 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
SOFSEM
2007
Springer
15 years 3 months ago
Automatic Testing of Object-Oriented Software
Effective testing involves preparing test oracles and test cases, two activities which are too tedious to be effectively performed by humans, yet for the most part remain manual. T...
Bertrand Meyer, Ilinca Ciupa, Andreas Leitner, Lis...
88
Voted
AGILEDC
2007
IEEE
15 years 3 months ago
On the Sustained Use of a Test-Driven Development Practice at IBM
Test-Driven Development (TDD) is an agile practice that is widely accepted and advocated by most agile methods and methodologists. In this paper, we report on a post hoc analysis ...
Julio Cesar Sanchez, Laurie A. Williams, E. Michae...
73
Voted
DATE
2002
IEEE
136views Hardware» more  DATE 2002»
15 years 2 months ago
Beyond UML to an End-of-Line Functional Test Engine
In this paper, we analyze the use of UML as a starting point to go from design issues to end of production testing of complex embedded systems. The first point is the analysis of ...
Andrea Baldini, Alfredo Benso, Paolo Prinetto, Ser...
TAICPART
2010
IEEE
158views Education» more  TAICPART 2010»
14 years 8 months ago
Bad Pairs in Software Testing
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is...
Daniel Hoffman, Chien Chang, Gary Bazdell, Brett S...