30 search results - page 2 / 6 » Testing Static and Dynamic Faults in Random Access Memories |
102
click to vote
VLSID
2009
IEEE
16 years 1 months ago
2009
IEEE
Abstract-- Single-ended static random access memory (SESRAM) is well known for their tremendous potential of low active power and leakage dissipations. In this paper, we present a ...
111
click to vote
DFT
1999
IEEE
15 years 5 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
112
click to vote
CATA
2009
15 years 2 months ago
2009
ABSTRACT: We present a Built-In Self-Test (BIST) approach for programmable embedded memories in Xilinx Virtex-4 Field Programmable Gate Arrays (FPGAs). The target resources are the...
121
click to vote
WADS
2009
Springer
15 years 7 months ago
2009
Springer
Abstract. Algorithms dealing with massive data sets are usually designed for I/O-efficiency, often captured by the I/O model by Aggarwal and Vitter. Another aspect of dealing with ...
104
click to vote
KBSE
2007
IEEE
15 years 7 months ago
2007
IEEE
Programs written in languages that provide direct access to memory through pointers often contain memory-related faults, which may cause non-deterministic failures and even securi...