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114
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DATE
2003
IEEE
15 years 7 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
ICSEA
2007
IEEE
15 years 8 months ago
2007
IEEE
Following the agile philosophy that all core features of a system need an automated test harness, performance requirements also need such a check when they are essential for the s...
109
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ICES
2010
Springer
15 years 13 days ago
2010
Springer
Abstract. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues ar...
140
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WPES
2003
ACM
15 years 7 months ago
2003
ACM
Traditionally, application software developers carry out their tests on their own local development databases. However, such local databases usually have only a small number of sa...
105
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ISSRE
2000
IEEE
15 years 6 months ago
2000
IEEE
A coverage testing tool ATACOBOL (Automatic Test Analysis for COBOL) that applies data flow coverage technique is developed for software development on IBM System/390 mainframe. W...