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122
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VTS
2008
IEEE
77views Hardware» more  VTS 2008»
15 years 9 months ago
Test-Pattern Ordering for Wafer-Level Test-During-Burn-In
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
Sudarshan Bahukudumbi, Krishnendu Chakrabarty
122
Voted
EEMMAS
2007
Springer
15 years 8 months ago
Combining Interface Agents and Situated Agents for Deploying Adaptive Web Applications
A web site presents a graph–like spatial structure composed of pages connected by hyperlinks. This structure may represent an environment in which situated agents associated to v...
Andrea Bonomi, Marcello Sarini, Giuseppe Vizzari
112
Voted
ECSCW
1997
15 years 4 months ago
MetaWeb: Bringing synchronous groupware to the World Wide Web
The World Wide Web is increasingly seen as an attractive technology for the deployment and evaluation of groupware However the underlying architecture of the Web is inherently stat...
Jonathan Trevor, Thomas Koch, Gerd Woetzel
SAC
2009
ACM
15 years 9 months ago
Network protocol interoperability testing based on contextual signatures and passive testing
This paper presents a methodology for interoperability testing based on contextual signatures and passive testing with invariants. The concept of contextual signature offers a fra...
Fatiha Zaïdi, Emmanuel Bayse, Ana R. Cavalli
WISE
2005
Springer
15 years 8 months ago
Asynchronous Web Services Communication Patterns in Business Protocols
Asynchronous interactions are becoming more and more important in the realization of complex B2B Web applications, and Web services are at the moment the most innovative and well-e...
Marco Brambilla, Giuseppe Guglielmetti, Christina ...