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174
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VLSID
2002
IEEE
16 years 7 months ago
2002
IEEE
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
174
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SOQUA
2004
15 years 8 months ago
2004
: In a component testing approach for evaluating system reliability, one tests units of the components or subsystems that make up a larger system in order to draw conclusions about...
158
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ITC
2003
IEEE
16 years 13 days ago
2003
IEEE
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes....
168
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FORTE
2003
15 years 8 months ago
2003
Abstract. The testing of a state-based system may involve the application of a number of adaptive test sequences. Where the implementation under test (IUT) is deterministic, the re...
158
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CN
2007
15 years 7 months ago
2007
The testing of a state-based system may involve the application of a number of adaptive test cases. Where the implementation under test (IUT) is deterministic, the response of the...