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143
Voted
ICST
2009
IEEE
15 years 9 months ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
114
Voted
GI
2009
Springer
15 years 5 days ago
2009
Springer
: This contribution addresses systematic test development methods to include an algorithm to retrieve a test suite execution control in order to run test cases with high priority e...
98
Voted
DAC
1999
ACM
16 years 3 months ago
1999
ACM
128
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DATE
2002
IEEE
15 years 7 months ago
2002
IEEE
In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test vector set by encoding the bits th...
100
click to vote
ITC
1998
IEEE
15 years 6 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...