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DOLAP
2009
ACM
16 years 20 days ago
A comprehensive approach to data warehouse testing
Testing is an essential part of the design life-cycle of any software product. Nevertheless, while most phases of data warehouse design have received considerable attention in the...
Matteo Golfarelli, Stefano Rizzi
159
Voted
GECCO
2004
Springer
197views Optimization» more  GECCO 2004»
15 years 11 months ago
Applying Evolutionary Testing to Search for Critical Defects
Software systems are used regularly in safety-relevant applications. Therefore, the occurrence of critical defects may not only cause costly recalls but may also endanger human liv...
André Baresel, Harmen Sthamer, Joachim Wege...
SIGSOFT
2003
ACM
15 years 11 months ago
Use case-based testing of product lines
This paper presents PLUTO, a simple and intuitive methodology to manage the testing process of product lines, described as Product Lines Use Cases (PLUCs). PLUCs are an extension ...
Antonia Bertolino, Stefania Gnesi
ICCAD
1997
IEEE
147views Hardware» more  ICCAD 1997»
15 years 10 months ago
Built-in test generation for synchronous sequential circuits
We consider the problem of built-in test generation for synchronous sequential circuits. The proposed scheme leaves the circuit flip-flops unmodified, and thus allows at-speed ...
Irith Pomeranz, Sudhakar M. Reddy
VTS
1997
IEEE
96views Hardware» more  VTS 1997»
15 years 10 months ago
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a sm...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...