4930 search results - page 127 / 986 » Testing a Safety-Critical Application |
175
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ICMCS
2006
IEEE
16 years 9 days ago
2006
IEEE
In this work, we develop a hierarchical load testing architecture using large scale virtual clients to reduce the testing time and ensure the stability of the server for distribut...
196
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SEKE
2005
Springer
15 years 11 months ago
2005
Springer
This paper presents a state-based approach to testing aspect-oriented programs. Aspectual state models, as an extension to the testable FREE state model of classes, are exploited ...
175
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DATE
2003
IEEE
15 years 11 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
134
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
Electrical testing of MicroElectroMechanical Systems (MEMS) can take on many different forms including wafer probing, electrical trimming, final test at temperatures, engineering ...
161
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ITC
2003
IEEE
15 years 11 months ago
2003
IEEE
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...