4930 search results - page 29 / 986 » Testing a Safety-Critical Application |
141
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VEE
2012
ACM
13 years 7 months ago
2012
ACM
In software for embedded systems, the frequent use of interrupts for timing, sensing, and I/O processing can cause concurrency faults to occur due to interactions between applicat...
VTS
1997
IEEE
15 years 3 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
FATES
2003
Springer
15 years 4 months ago
2003
Springer
Abstract. We adapt and extend the theories used in the general framework of automated software testing in such a way that they become suitable for black-box conformance testing of ...
107
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APAQS
2000
IEEE
15 years 4 months ago
2000
IEEE
Recently, the extraordinarygrowth in the World Wide Web has been sweeping through business and industry. Many companies have developed or integrated their mission-critical applica...
103
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DATE
1999
IEEE
15 years 3 months ago
1999
IEEE
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...