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ICST
2008
IEEE
15 years 6 months ago
Relationships between Test Suites, Faults, and Fault Detection in GUI Testing
Software-testing researchers have long sought recipes for test suites that detect faults well. In the literature, empirical studies of testing techniques abound, yet the ideal tec...
Jaymie Strecker, Atif M. Memon
DATE
2003
IEEE
114views Hardware» more  DATE 2003»
15 years 5 months ago
A New Approach to Test Generation and Test Compaction for Scan Circuits
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
Irith Pomeranz, Sudhakar M. Reddy
SP
2010
IEEE
212views Security Privacy» more  SP 2010»
15 years 3 months ago
State of the Art: Automated Black-Box Web Application Vulnerability Testing
—Black-box web application vulnerability scanners are automated tools that probe web applications for security vulnerabilities. In order to assess the current state of the art, w...
Jason Bau, Elie Bursztein, Divij Gupta, John C. Mi...
ICSEA
2007
IEEE
15 years 6 months ago
A Tool for Automated Performance Testing of Java3D Applications in Agile Environments
Following the agile philosophy that all core features of a system need an automated test harness, performance requirements also need such a check when they are essential for the s...
Xueling Shu, Frank Maurer
ICES
2010
Springer
106views Hardware» more  ICES 2010»
14 years 9 months ago
The Use of Genetic Algorithm to Reduce Power Consumption during Test Application
Abstract. In this paper it is demonstrated how two issues from the area of testing electronic components can be merged and solved by means of a genetic algorithm. The two issues ar...
Jaroslav Skarvada, Zdenek Kotásek, Josef St...