4930 search results - page 60 / 986 » Testing a Safety-Critical Application |
140
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DSD
2010
IEEE
15 years 4 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
127
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DDECS
2007
IEEE
15 years 11 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
117
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ACMSE
2006
ACM
15 years 10 months ago
2006
ACM
Like in other fields, computer products (applications, hardware, etc.), before being marketed, require some level of testing to verify whether they meet their design and function...
123
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DATE
2007
IEEE
15 years 11 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
144
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ISOLA
2004
Springer
15 years 10 months ago
2004
Springer
The article is concerned with an approach to model based test development for large software systems. The approach presented is a part of UniTesK test development technology, which...