4930 search results - page 66 / 986 » Testing a Safety-Critical Application |
129
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FCCM
2007
IEEE
15 years 11 months ago
2007
IEEE
This paper provides an evaluation of SGI® RASC™ RC100 technology from a computational science software developer’s perspective. A brute force implementation of a two-point an...
149
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ATS
2010
IEEE
15 years 1 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
168
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ATS
2005
IEEE
15 years 10 months ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
146
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IEEEPACT
2009
IEEE
15 years 11 months ago
2009
IEEE
—Software testing is hard. The emergence of multicore architectures and the proliferation of bugprone multithreaded software makes testing even harder. To this end, researchers h...
158
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GECCO
2003
Springer
15 years 9 months ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...