4930 search results - page 67 / 986 » Testing a Safety-Critical Application |
149
Voted
KDD
2000
ACM
15 years 8 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
145
Voted
SOQUA
2007
15 years 5 months ago
2007
With the proliferation of the new multi-core personal computers, and the explosion of the usage of highly concurrent machine configuration, concurrent code moves from being writt...
104
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DATE
2007
IEEE
15 years 11 months ago
2007
IEEE
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
141
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EURODAC
1995
IEEE
15 years 8 months ago
1995
IEEE
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
169
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CVPR
2012
IEEE
13 years 7 months ago
2012
IEEE
The use of statistical pattern recognition models to segment the left ventricle of the heart in ultrasound images has gained substantial attention over the last few years. The mai...