4930 search results - page 68 / 986 » Testing a Safety-Critical Application |
129
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ATS
2004
IEEE
15 years 8 months ago
2004
IEEE
An efficient design for test methodology to increase the test yield of analog circuits is presented. It is assumed that the analog circuits are tested using alternate tests that r...
146
Voted
RANDOM
1997
Springer
15 years 8 months ago
1997
Springer
The current proof of the PCP Theorem (i.e., NP = PCP(log, O(1))) is very complicated. One source of difficulty is the technically involved analysis of low-degree tests. Here, we r...
119
Voted
SE
2007
15 years 6 months ago
2007
: The application of scientifically derived theories on software testing strongly depends on their ability to provide a value for practice. We provide a comprehensive review on the...
102
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ITC
1997
IEEE
15 years 8 months ago
1997
IEEE
Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of applicability. The new concept of the current signature may expand this limit under t...
149
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IJCSA
2007
15 years 4 months ago
2007
This article presents experiences in the automation of a testing process. The main goal is the unified testing of not only one program, but a whole family of programs. The family ...