Sciweavers

4930 search results - page 70 / 986
» Testing a Safety-Critical Application
Sort
View
ITC
2000
IEEE
104views Hardware» more  ITC 2000»
15 years 9 months ago
Application of deterministic logic BIST on industrial circuits
We present the application of a deterministic logic BIST scheme on state-of-the-art industrial circuits. Experimental results show that complete fault coverage can be achieved for...
Gundolf Kiefer, Hans-Joachim Wunderlich, Harald P....
136
Voted
GLVLSI
2002
IEEE
98views VLSI» more  GLVLSI 2002»
15 years 9 months ago
Minimizing concurrent test time in SoC's by balancing resource usage
We present a novel test scheduling algorithm for embedded corebased SoC’s. Given a system integrated with a set of cores and a set of test resources, we select a test for each c...
Dan Zhao, Shambhu J. Upadhyaya, Martin Margala
INFSOF
2006
151views more  INFSOF 2006»
15 years 4 months ago
Prioritized interaction testing for pair-wise coverage with seeding and constraints
Interaction testing is widely used in screening for faults. In software testing, it provides a natural mechanism for testing systems to be deployed on a variety of hardware and so...
Renée C. Bryce, Charles J. Colbourn
ISCIS
2003
Springer
15 years 9 months ago
Test Case Generation According to the Binary Search Strategy
One of the important tasks during software testing is the generation of test cases. Unfortunately, existing approaches to test case generation often have problems limiting their us...
Sami Beydeda, Volker Gruhn
148
Voted
ACSD
2001
IEEE
102views Hardware» more  ACSD 2001»
15 years 8 months ago
Exploration Testing
This paper describes a new way of testing reactive systems as investigated by the RATE-project at the Tampere University of Technology. We abandon the idea of systematically using...
Juhana Helovuo, Sari Leppänen