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» Testing a Safety-Critical Application
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164
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DAC
2003
ACM
15 years 10 months ago
Efficient compression and application of deterministic patterns in a logic BIST architecture
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
Peter Wohl, John A. Waicukauski, Sanjay Patel, Min...
142
Voted
VLSID
2002
IEEE
115views VLSI» more  VLSID 2002»
16 years 5 months ago
A Partitioning and Storage Based Built-In Test Pattern Generation Method for Scan Circuits
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
Irith Pomeranz, Sudhakar M. Reddy
126
Voted
SE
2008
15 years 6 months ago
A TTCN-3-based Web Service Test Framework
: The increased usage of Web services for critical applications introduces a growing need for efficient testing approaches to assure their quality. The Testing and Test Control Not...
Edith Werner, Jens Grabowski, Stefan Troschüt...
132
Voted
SOQUA
2004
15 years 6 months ago
An Optimum, System-Based Component Testing Approach for Evaluating Software Reliability
: In a component testing approach for evaluating system reliability, one tests units of the components or subsystems that make up a larger system in order to draw conclusions about...
Jayant Rajgopal, Mainak Mazumdar
119
Voted
ITC
2003
IEEE
114views Hardware» more  ITC 2003»
15 years 10 months ago
Test-Based Model Generation For Legacy Systems
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes....
Hardi Hungar, Tiziana Margaria, Bernhard Steffen