We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
Peter Wohl, John A. Waicukauski, Sanjay Patel, Min...
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
: The increased usage of Web services for critical applications introduces a growing need for efficient testing approaches to assure their quality. The Testing and Test Control Not...
: In a component testing approach for evaluating system reliability, one tests units of the components or subsystems that make up a larger system in order to draw conclusions about...
We study the extension of applicability of system-level testing techniques to the construction of a consistent model of (legacy) systems under test, which are seen as black boxes....