4930 search results - page 76 / 986 » Testing a Safety-Critical Application |
140
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VTS
2003
IEEE
15 years 10 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
129
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ITC
2003
IEEE
15 years 10 months ago
2003
IEEE
Today’s ASIC designs consist of more memory in terms of both area and number of instances. The shrinking of geometries has an even greater effect upon memories due to their tigh...
133
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VTS
2005
IEEE
15 years 10 months ago
2005
IEEE
This paper presents a test architecture that addresses multiple problems faced in digital IC testing. These problems are test data volume, test application time, test power consum...
164
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ACSAC
2007
IEEE
15 years 11 months ago
2007
IEEE
With the recent rapid increase in interactive web applications that employ back-end database services, an SQL injection attack has become one of the most serious security threats....
135
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VLSID
2002
IEEE
16 years 5 months ago
2002
IEEE
We present a mathematical model for the problem of scheduling tests for core-based system-on-chip (SOC) VLSI designs. Given a set of tests for each core in the SOC and a set of te...