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WCE
2007
15 years 6 months ago
An Approach to Test Aspect-oriented Programs
— Software testing is a perennial problem, consequently it scores scant attention. An inclusion to testing challenges is aspect-oriented paradigm, which has a dichotomy of core a...
M. N. Qamar, Aziz Nadeem, R. Aziz
ITC
2003
IEEE
102views Hardware» more  ITC 2003»
15 years 10 months ago
Evolution of IEEE 1149.1 Addressable Shadow Protocol Devices
This paper describes an Addressable Shadow Protocol device that is capable of providing connectivity between a backplane resident IEEE 1149.1 test bus master and a plurality of 11...
Rakesh N. Joshi, Kenneth L. Williams, Lee Whetsel
DATE
2009
IEEE
138views Hardware» more  DATE 2009»
15 years 11 months ago
Scalable Adaptive Scan (SAS)
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
Anshuman Chandra, Rohit Kapur, Yasunari Kanzawa
150
Voted
PKC
1999
Springer
83views Cryptology» more  PKC 1999»
15 years 9 months ago
On the Security of Random Sources
Abstract. Many applications rely on the security of their random number generator. It is therefore essential that such devices be extensively tested for malfunction. The purpose of...
Jean-Sébastien Coron
130
Voted
IPPS
2006
IEEE
15 years 11 months ago
Fault injection in distributed Java applications
In a network consisting of several thousands computers, the occurrence of faults is unavoidable. Being able to test the behaviour of a distributed program in an environment where ...
William Hoarau, Sébastien Tixeuil, Fabien V...