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DATE
2008
IEEE
138views Hardware» more  DATE 2008»
15 years 11 months ago
Functional Self-Testing for Bus-Based Symmetric Multiprocessors
Functional, instruction-based self-testing of microprocessors has recently emerged as an effective alternative or supplement to other testing approaches, and is progressively adop...
Andreas Apostolakis, Dimitris Gizopoulos, Mihalis ...
ICSE
2009
IEEE-ACM
16 years 5 months ago
Maintaining and evolving GUI-directed test scripts
Since manual black-box testing of GUI-based APplications (GAPs) is tedious and laborious, test engineers create test scripts to automate the testing process. These test scripts in...
Mark Grechanik, Qing Xie, Chen Fu
VLSID
2002
IEEE
131views VLSI» more  VLSID 2002»
16 years 5 months ago
Divide-and-Conquer IDDQ Testing for Core-Based System Chips
IDDQ testing has been used as a test technique to supplement voltage testing of CMOS chips. The idea behind IDDQ testing is to declare a chip as faulty if the steady-state current...
C. P. Ravikumar, Rahul Kumar
117
Voted
VTS
2000
IEEE
95views Hardware» more  VTS 2000»
15 years 9 months ago
DEFUSE: A Deterministic Functional Self-Test Methodology for Processors
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
Li Chen, Sujit Dey
GECCO
2008
Springer
172views Optimization» more  GECCO 2008»
15 years 6 months ago
Empirical analysis of a genetic algorithm-based stress test technique
Evolutionary testing denotes the use of evolutionary algorithms, e.g., Genetic Algorithms (GAs), to support various test automation tasks. Since evolutionary algorithms are heuris...
Vahid Garousi