47 search results - page 5 / 10 » Testing and built-in self-test - A survey |
70
Voted
DATE
2003
IEEE
15 years 2 months ago
2003
IEEE
Built-In Self-Test (BIST) becomes important also for more complex structures like complete front-ends. In order to bring down the costs for the test overhead, Spectral Signature A...
77
Voted
VLSID
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
MTDT
2000
IEEE
15 years 1 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
57
Voted
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
A (partial) Built-In Self-Test (BIST) methodology is proposed for analog to digital (MD)converters. In this methodology the number of bits of the A/Dconverter that needs to be mon...