47 search results - page 6 / 10 » Testing and built-in self-test - A survey |
MTDT
2000
IEEE
15 years 4 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
DATE
2006
IEEE
15 years 5 months ago
2006
IEEE
Pseudorandom test techniques are widely used for measuring the impulse response (IR) for linear devices and Volterra kernels for nonlinear devices, especially in the acoustics dom...
ISCAS
2005
IEEE
15 years 5 months ago
2005
IEEE
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...
ITC
2002
IEEE
15 years 4 months ago
2002
IEEE
: We present a Built-In Self-Test (BIST)-based diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either...
ITC
2003
IEEE
15 years 4 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...