47 search results - page 8 / 10 » Testing and built-in self-test - A survey |
86
Voted
DATE
2008
IEEE
15 years 4 months ago
2008
IEEE
Abstract— We present a general method to evaluate RF BuiltIn Self-Test (BIST) techniques during the design stage. In particular, the adaptive kernel estimator is used to construc...
113
Voted
CSREAESA
2010
14 years 7 months ago
2010
The primary goal of Built-In Self-Test (BIST) for Field Programmable Gate Arrays (FPGAs) is to completely test all programmable logic and routing resources in the device such that ...
80
Voted
ITC
2003
IEEE
15 years 2 months ago
2003
IEEE
Abstract: We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000...
77
Voted
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
: Accurate diagnosis is an essential requirement in many testing environments, since it is the basis for any repair or replacement strategy used for chip or system fault-tolerance....
VLSID
2004
IEEE
15 years 10 months ago
2004
IEEE
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...