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VLSID
2005
IEEE
131views VLSI» more  VLSID 2005»
16 years 2 months ago
Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
77
Voted
MVA
2000
115views Computer Vision» more  MVA 2000»
15 years 3 months ago
Image Retrieval through Abstract Shape Indication
trieval through Abstract Shape Indication A. Brucale, F. Cesari, M. d'Amico, M. Ferri, P. Frosini, L. Gualandri, M. Guerra, A. Lovato, I. Pace Dip. di Matematica, Universit`a ...
Aldo Brucale, Fabio Cesari, Michele d'Amico, Massi...
COMPGEOM
2008
ACM
15 years 3 months ago
Testing contractibility in planar rips complexes
toris-)Rips complex of a discrete point-set P is an abstract simplicial complex in
Erin W. Chambers, Jeff Erickson, Pratik Worah
112
Voted
ASYNC
2000
IEEE
122views Hardware» more  ASYNC 2000»
15 years 6 months ago
DUDES: A Fault Abstraction and Collapsing Framework for Asynchronous Circuits
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
Philip P. Shirvani, Subhasish Mitra, Jo C. Ebergen...
102
Voted
SE
2007
15 years 3 months ago
New test approach for embedded applications
: This paper is a tutorial on the principles and applications of static tion by Abstract Interpretation to development, verification and validation ded applications. The topics cov...
Alain Deutsch, Klaus Wissing