Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
trieval through Abstract Shape Indication A. Brucale, F. Cesari, M. d'Amico, M. Ferri, P. Frosini, L. Gualandri, M. Guerra, A. Lovato, I. Pace Dip. di Matematica, Universit`a ...
Fault Abstraction and Collapsing Framework for Asynchronous Circuits Philip P. Shirvani, Subhasish Mitra Center for Reliable Computing Stanford University Stanford, CA Jo C. Eberge...
Philip P. Shirvani, Subhasish Mitra, Jo C. Ebergen...
: This paper is a tutorial on the principles and applications of static tion by Abstract Interpretation to development, verification and validation ded applications. The topics cov...