2302 search results - page 22 / 461 » Testing as Abstraction |
154
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PKC
1999
Springer
15 years 9 months ago
1999
Springer
Abstract. Many applications rely on the security of their random number generator. It is therefore essential that such devices be extensively tested for malfunction. The purpose of...
167
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ITC
1996
IEEE
15 years 9 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
146
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ICST
2010
IEEE
15 years 3 months ago
2010
IEEE
Abstract—In this paper we introduce Timed Moore Automata, a specification formalism which is used in industrial train control applications for specifying the real-time behavior ...
154
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ICST
2008
IEEE
15 years 11 months ago
2008
IEEE
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
163
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TVLSI
2010
15 years 2 days ago
2010
Abstract--Higher circuit densities in system-on-chip (SOC) designs have led to drastic increase in test data volume. Larger test data size demands not only higher memory requiremen...