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93
Voted
SE
2010
15 years 3 months ago
2010
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
115
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TAICPART
2006
IEEE
15 years 8 months ago
2006
IEEE
ract: Problem Statement and Hypothetical Solutions Shaukat Ali Verification and Testing Group (VT) Department of Computer Science University of Sheffield
105
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DATE
2008
IEEE
15 years 8 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
IPCO
1996
15 years 3 months ago
1996
abstract Preprint SC-95-36 (Dezember 1995)
146
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AMOST
2007
ACM
15 years 5 months ago
2007
ACM
When integrating dierent system components, the interaction between dierent features is often error prone. Typically errors occur on interruption, concurrency or disabling/ enabli...