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129
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TE
2010
168views more  TE 2010»
14 years 10 months ago
Industry-Oriented Laboratory Development for Mixed-Signal IC Test Education
The semiconductor industry is lacking qualified integrated circuit (IC) test engineers to serve in the field of mixed-signal electronics. The absence of mixed-signal IC test educat...
John Hu, Mark Haffner, Samantha Yoder, Mark Scott,...
120
Voted
ICCAD
1995
IEEE
120views Hardware» more  ICCAD 1995»
15 years 7 months ago
Pattern generation for a deterministic BIST scheme
Recently a deterministic built-in self-test scheme has been presented based on reseeding of multiple-polynomial linear feedback shift registers. This scheme encodes deterministic ...
Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, ...
124
Voted
PLDI
2012
ACM
13 years 6 months ago
Test-case reduction for C compiler bugs
To report a compiler bug, one must often find a small test case that triggers the bug. The existing approach to automated test-case reduction, delta debugging, works by removing ...
John Regehr, Yang Chen, Pascal Cuoq, Eric Eide, Ch...
TASE
2009
IEEE
15 years 10 months ago
Fault-Based Test Case Generation for Component Connectors
The complex interactions appearing in service-oriented computing make coordination a key concern in serviceoriented systems. In this paper, we present a fault-based method to gene...
Bernhard K. Aichernig, Farhad Arbab, Lacramioara A...
FORMATS
2009
Springer
15 years 10 months ago
Exploiting Timed Automata for Conformance Testing of Power Measurements
For software development, testing is still the primary choice for investigating the correctness of a system. Automated testing is of utmost importance to support continuous integra...
Matthias Woehrle, Kai Lampka, Lothar Thiele