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173
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SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
15 years 9 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
117
Voted
WER
2004
Springer
15 years 9 months ago
Structural Testing with Use Cases
Understanding how a user interacts with a system is important if the goal is to deliver a product that meets the user's needs. Use cases constitute a primary source of require...
Adriana Carniello, Mario Jino, Marcos Lordello Cha...
149
Voted
DATE
1999
IEEE
147views Hardware» more  DATE 1999»
15 years 8 months ago
Efficient BIST Hardware Insertion with Low Test Application Time for Synthesized Data Paths
In this paper, new and efficient BIST methodology and BIST hardware insertion algorithms are presented for RTL data paths obtained from high level synthesis. The methodology is ba...
Nicola Nicolici, Bashir M. Al-Hashimi
KBSE
1997
IEEE
15 years 8 months ago
Genetic Algorithms for Dynamic Test Data Generation
In software testing, it is often desirable to find test inputs that exercise specific program features. To find these inputs by hand is extremely time-consuming, especially whe...
Christoph C. Michael, Gary McGraw, Michael Schatz,...
HOTSWUP
2009
ACM
15 years 7 months ago
Efficient Systematic Testing for Dynamically Updatable Software
Recent years have seen significant advances in dynamic software updating (DSU) systems, which allow programs to be patched on the fly. However, a significant challenge remains: Ho...
Christopher M. Hayden, Eric A. Hardisty, Michael W...