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ET
2000
80views more  ET 2000»
15 years 3 months ago
A New Method for Testing Re-Programmable PLAs
: We present a method for obtaining a minimal set of test configurations and their associated set oftest patterns that completely tests re-programmable Programmable Logic Arrays (P...
Charles E. Stroud, James R. Bailey, Johan R. Emmer...
TCAD
2010
102views more  TCAD 2010»
14 years 10 months ago
Functional Test Generation Using Efficient Property Clustering and Learning Techniques
Abstract--Functional verification is one of the major bottlenecks in system-on-chip design due to the combined effects of increasing complexity and lack of automated techniques for...
Mingsong Chen, Prabhat Mishra
DAC
2008
ACM
16 years 4 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...
SIGSOFT
2005
ACM
16 years 4 months ago
CUTE: a concolic unit testing engine for C
In unit testing, a program is decomposed into units which are collections of functions. A part of unit can be tested by generating inputs for a single entry function. The entry fu...
Koushik Sen, Darko Marinov, Gul Agha
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
16 years 4 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen