6941 search results - page 306 / 1389 » Testing as a Certification Approach |
134
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DATE
2003
IEEE
15 years 10 months ago
2003
IEEE
One of the difficult problems which core-based systemon-chip (SoC) designs face is test access. For testing the cores in a SoC, a special mechanism is required, since they are no...
126
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ECIS
2003
15 years 6 months ago
2003
One of the primary methods employed by researchers to judge the merits of new heuristics and algorithms is to run them on accepted benchmark test cases and comparing their perform...
128
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CSDA
2008
15 years 5 months ago
2008
This paper is concerned withANOVA-like tests in the context of mixed discrete and continuous data. The likelihood ratio approach is used to obtain a location test in the mixed dat...
104
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DATE
2008
IEEE
15 years 11 months ago
2008
IEEE
This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...
139
Voted
ICSE
2008
IEEE-ACM
16 years 5 months ago
2008
IEEE-ACM
Fault-localization techniques that utilize information about all test cases in a test suite have been presented. These techniques use various approaches to identify the likely fau...