11718 search results - page 119 / 2344 » Testing database applications |
290
Voted
ICDE
2001
IEEE
16 years 7 months ago
2001
IEEE
High availability for both data and applications is rapidly becoming a business requirement. While database systems support recovery, providing high database availability, applica...
151
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FCCM
2007
IEEE
16 years 21 days ago
2007
IEEE
This paper provides an evaluation of SGI® RASC™ RC100 technology from a computational science software developer’s perspective. A brute force implementation of a two-point an...
186
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ATS
2010
IEEE
15 years 3 months ago
2010
IEEE
Systems with many integrated circuits (ICs), often of the same type, are increasingly common to meet the constant performance demand. However, systems in recent semiconductor techn...
196
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ATS
2005
IEEE
16 years 7 hour ago
2005
IEEE
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
198
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DEXAW
2005
IEEE
15 years 8 months ago
2005
IEEE
Data mining applications are typically used in the decision making process. The Knowledge Discovery Process (KDD process for short) is a typical iterative process, in which not on...