11718 search results - page 121 / 2344 » Testing database applications |
171
Voted
EDBT
2009
ACM
15 years 10 months ago
2009
ACM
Many Web applications are based on dynamic interactions between Web components exchanging flows of information. Such a situation arises for instance in mashup systems or when moni...
174
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KDD
2000
ACM
15 years 10 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
186
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SOQUA
2007
15 years 7 months ago
2007
With the proliferation of the new multi-core personal computers, and the explosion of the usage of highly concurrent machine configuration, concurrent code moves from being writt...
125
Voted
DATE
2007
IEEE
16 years 22 days ago
2007
IEEE
This paper proposes an efficient test methodology to test switches in a Network-on-Chip (NoC) architecture. A switch in an NoC consists of a number of ports and a router. Using th...
174
Voted
EURODAC
1995
IEEE
15 years 10 months ago
1995
IEEE
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...