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DATE
2006
IEEE
108views Hardware» more  DATE 2006»
16 years 14 days ago
Test compaction for transition faults under transparent-scan
Transparent-scan was proposed as an approach to test generation and test compaction for scan circuits. Its effectiveness was demonstrated earlier in reducing the test application ...
Irith Pomeranz, Sudhakar M. Reddy
150
Voted
BTW
2005
Springer
82views Database» more  BTW 2005»
15 years 12 months ago
Using Aspect-Orientation to Add Persistency to Applications
: This paper presents a comfortable and customizable persistence framework that supports the access of relational databases from Java applications. In order to keep the effort for ...
Uwe Hohenstein
ESE
2008
107views Database» more  ESE 2008»
15 years 6 months ago
Realizing quality improvement through test driven development: results and experiences of four industrial teams
Test-driven development (TDD) is a software development practice that has been used sporadically for decades. With this practice, a software engineer cycles minute-by-minute betwee...
Nachiappan Nagappan, E. Michael Maximilien, Thirum...
DEXAW
2007
IEEE
92views Database» more  DEXAW 2007»
16 years 22 days ago
Subtree Testing and Closed Tree Mining Through Natural Representations
Several classical schemes exist to represent trees as strings over a fixed alphabet; these are useful in many algorithmic and conceptual studies. Our previous work has proposed a...
José L. Balcázar, Albert Bifet, Anto...
140
Voted
QSIC
2007
IEEE
16 years 20 days ago
Testing against Natural Language Requirements
: Testing against natural language requirements is the standard approach for system and acceptance testing. This test is often performed by an independent test organization unfamil...
Harry M. Sneed