Sciweavers

80 search results - page 6 / 16
» Testing embedded-core based system chips
Sort
View
87
Voted
DATE
2003
IEEE
96views Hardware» more  DATE 2003»
15 years 2 months ago
Test Data Compression: The System Integrator's Perspective
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
Paul Theo Gonciari, Bashir M. Al-Hashimi, Nicola N...
HIPEAC
2005
Springer
15 years 3 months ago
Power Aware External Bus Arbitration for System-on-a-Chip Embedded Systems
Abstract. Power efficiency has become a key design trade-off in embedded system designs. For system-on-a-chip embedded systems, an external bus interconnects embedded processor co...
Ke Ning, David R. Kaeli
ICCAD
2002
IEEE
146views Hardware» more  ICCAD 2002»
15 years 6 months ago
Test-model based hierarchical DFT synthesis
With increasing design sizes and adoption of System on a Chip (SoC) methodology, design synthesis and test automation tools are hitting capacity and performance bottlenecks. Curre...
Sanjay Ramnath, Frederic Neuveux, Mokhtar Hirech, ...
88
Voted
VLSI
2005
Springer
15 years 2 months ago
Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint
1 The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automa...
Erik Larsson, Stina Edbom
CCECE
2006
IEEE
15 years 3 months ago
QOS Driven Network-on-Chip Design for Real Time Systems
Real Time embedded system designers are facing extreme challenges in underlying architectural design selection. It involves the selection of a programmable, concurrent, heterogene...
Ankur Agarwal, Mehmet Mustafa, Abhijit S. Pandya