1664 search results - page 226 / 333 » Testing in the Component Age |
DAC
2005
ACM
15 years 11 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
ICSE
2009
IEEE-ACM
15 years 10 months ago
2009
IEEE-ACM
We present a new automated white box fuzzing technique and a tool, BuzzFuzz, that implements this technique. Unlike standard fuzzing techniques, which randomly change parts of the...
DDECS
2007
IEEE
15 years 4 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
CP
2007
Springer
15 years 4 months ago
2007
Springer
Abstract. Alcatel-Lucent is a major player in the eld of telecommunications. One of the products it oers to network operators is wireless infrastructure such as base stations. Su...
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DIS
2007
Springer
15 years 4 months ago
2007
Springer
We describe a technique for comparing distributions without the need for density estimation as an intermediate step. Our approach relies on mapping the distributions into a reprodu...