1664 search results - page 22 / 333 » Testing in the Component Age |
150
Voted
GECCO
2009
Springer
16 years 12 days ago
2009
Springer
The objectives of this paper are to describe a steady-state version of the Age-Layered Population Structure (ALPS) Evolutionary Algorithm (EA) and to compare it against other GAs ...
131
click to vote
DFT
2005
IEEE
15 years 11 months ago
2005
IEEE
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...
138
click to vote
SEKE
2004
Springer
15 years 11 months ago
2004
Springer
Development of a software system from existing components can surely have various benefits, but can also entail a series of problems. One type of problems is caused by a limited ...
175
click to vote
ISSRE
2000
IEEE
15 years 10 months ago
2000
IEEE
Despite the growing interest for component-based systems, few works tackle the question of the trust we can bring into a component. This paper presents a method and a tool for bui...
120
click to vote
DATE
2007
IEEE
16 years 6 days ago
2007
IEEE
Moore’s Law will soon deliver tera-scale level transistor integration capacity. Power, variability, reliability, aging, and testing will pose as barriers and challenges to harne...