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» Testing in the Component Age
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DATE
2007
IEEE
106views Hardware» more  DATE 2007»
15 years 4 months ago
Low-cost protection for SER upsets and silicon defects
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kyp...
GLOBECOM
2007
IEEE
15 years 4 months ago
Probabilistic-Based Rate Adaptation for IEEE 802.11 WLANs
— Collision awareness has been recognized as a critical component for effective rate adaptation schemes. Recently, several collision-aware rate adaptation schemes have been propo...
Xi Chen, Daji Qiao, Jeonggyun Yu, Sunghyun Choi
IROS
2007
IEEE
119views Robotics» more  IROS 2007»
15 years 4 months ago
Scalable SLAM building conditionally independent local maps
— Local maps algorithms have demonstrated to be well suited for mapping large environments as can reduce the computational cost and improve the consistency of the final estimati...
Pedro Pinies, Juan D. Tardós
ISCAS
2007
IEEE
78views Hardware» more  ISCAS 2007»
15 years 4 months ago
Towards Automated Power Gating of Registers using CoDeL
— In this paper, we use the CoDeL platform to develop test circuits and analyze the potential and performance impact of power gating individual registers. For each register, we e...
Nainesh Agarwal, Nikitas J. Dimopoulos
AE
2007
Springer
15 years 4 months ago
The Cooperative Royal Road: Avoiding Hitchhiking
We propose using the so called Royal Road functions as test functions for cooperative co-evolutionary algorithms (CCEAs). The Royal Road functions were created in the early 90’s ...
Gabriela Ochoa, Evelyne Lutton, Edmund K. Burke