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» Testing in the Component Age
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ICSE
2012
IEEE-ACM
13 years 5 days ago
WhoseFault: Automatic developer-to-fault assignment through fault localization
—This paper describes a new technique, which automatically selects the most appropriate developers for fixing the fault represented by a failing test case, and provides a diagno...
Francisco Servant, James A. Jones
ICPR
2004
IEEE
15 years 11 months ago
An Undecimated Wavelet Transform Based Denoising, PPCA Based Pulse Modeling and Detection-Classification of PD Signals
Authors Address the problem of recognition and retrieval of relatively weak industrial signal such as Partial Discharges (PD) buried in excessive noise. The major bottleneck being...
Pradeep Kumar Shetty, T. S. Ramu
OSDI
2008
ACM
15 years 10 months ago
Automating Network Application Dependency Discovery: Experiences, Limitations, and New Solutions
Abstract ? Large enterprise networks consist of thousands of services and applications. The performance and reliability of any particular application may depend on multiple service...
Xu Chen, Ming Zhang, Zhuoqing Morley Mao, Paramvir...
EUROSYS
2008
ACM
15 years 6 months ago
BorderPatrol: isolating events for black-box tracing
Causal request traces are valuable to developers of large concurrent and distributed applications, yet difficult to obtain. Traces show how a request is processed, and can be anal...
Eric Koskinen, John Jannotti
ATAL
2009
Springer
15 years 4 months ago
Comparing trust mechanisms for monitoring aggregator nodes in sensor networks
Sensor nodes are often used to collect data from locations inaccessible or hazardous for humans. As they are not under normal supervision, these nodes are particularly susceptible...
Oly Mistry, Anil Gürsel, Sandip Sen