741 search results - page 35 / 149 » Testing in the year 2020 |
DATE
2007
IEEE
15 years 7 months ago
2007
IEEE
RFIC reliability is fast becoming a major bottleneck in the yield and performance of modern IC systems, as process complexity and levels of integration continually increase. Due t...
DDECS
2007
IEEE
15 years 7 months ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
110
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ECAI
2004
Springer
15 years 6 months ago
2004
Springer
Recent years have seen considerable developments in modeling techniques for automatic fault location in programs. However, much of this research considered the models from a standa...
108
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DISCO
1992
15 years 5 months ago
1992
It is generally accepted that special purpose algebraic systems are more efficient than general purpose ones, but as machines get faster this does not matter. An experiment has be...
113
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EMNLP
2007
15 years 2 months ago
2007
The Conference on Computational Natural Language Learning features a shared task, in which participants train and test their learning systems on the same data sets. In 2007, as in...