2686 search results - page 128 / 538 » Testing metric properties |
VLSID
2003
IEEE
16 years 1 months ago
2003
IEEE
Increasing values and spread in leakage current makes it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer ...
130
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APSCC
2009
IEEE
15 years 7 months ago
2009
IEEE
What is a cloud application precisely? In this paper, we formulate a computing cloud as a kind of graph, a computing resource such as services or intellectual property access righ...
ASPDAC
2004
ACM
15 years 6 months ago
2004
ACM
- In this paper, we employ a monitor-based approach for on-chip bus (OCB) compliance test. To describe the OCB protocols,we proposea FSM model, which can help to extract the necess...
62
Voted
CLEF
2001
Springer
15 years 5 months ago
2001
Springer
Participating in a text retrieval conference for the first time, Eidetica has run six minimalistic tests with its t·repository indexer, doing as little tuning as possible, in ord...
132
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APPROX
2010
Springer
15 years 1 months ago
2010
Springer
We study the problem of monotonicity testing over the hypercube. As previously observed in several works, a positive answer to a natural question about routing properties of the hy...