2686 search results - page 138 / 538 » Testing metric properties |
90
Voted
ACL
2009
14 years 11 months ago
2009
This paper presents DEPEVAL(summ), a dependency-based metric for automatic evaluation of summaries. Using a reranking parser and a Lexical-Functional Grammar (LFG) annotation, we ...
114
Voted
NDSS
2000
IEEE
15 years 5 months ago
2000
IEEE
This paper describes automatic protocol generation (APG for short), a novel mechanism to generate security protocols automatically. With APG, the protocol designer inputs the spec...
95
Voted
VTS
1999
IEEE
15 years 5 months ago
1999
IEEE
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
ICST
2009
IEEE
15 years 7 months ago
2009
IEEE
Since manual black-box testing of GUI-based APplications (GAPs) is tedious and laborious, test engineers create test scripts to automate the testing process. These test scripts in...
90
Voted
ISVC
2007
Springer
15 years 7 months ago
2007
Springer
This paper presents a technique that allows test engineers to visually analyze and explore within memory chip test data. We represent the test results from a generation of chips al...