2686 search results - page 171 / 538 » Testing metric properties |
142
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ITC
1994
IEEE
15 years 9 months ago
1994
IEEE
: The IC test industry has struggled .for more than 30years to establish a test approach that would guarantee a low defect level to the customer. Wepropose a comprehensive strategy...
141
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ICPR
2002
IEEE
16 years 6 months ago
2002
IEEE
Robustness of parameter estimation relies on discriminating inliers from outliers within the set of correspondences. In this paper, we present a method using tensor voting to elim...
152
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ICML
2008
IEEE
16 years 6 months ago
2008
IEEE
We present a data structure enabling efficient nearest neighbor (NN) retrieval for bregman divergences. The family of bregman divergences includes many popular dissimilarity measu...
175
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ICML
1996
IEEE
16 years 6 months ago
1996
IEEE
We introduce a method for learning Bayesian networks that handles the discretization of continuous variables as an integral part of the learning process. The main ingredient in th...
138
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INFOCOM
2009
IEEE
16 years 6 days ago
2009
IEEE
Abstract—Opportunistic routing (OR) has received much attention as a new routing paradigm due to its efficient utilization of broadcasting and spacial diversity of the wireless ...