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EURODAC
1994
IEEE
123views VHDL» more  EURODAC 1994»
15 years 1 months ago
Testing redundant asynchronous circuits by variable phase splitting
An approach for stuck-at-i and delay-fault testing of redundant circuits without modifying the logic is proposed. The only requirement is the ability to control both phases of eac...
Luciano Lavagno, Antonio Lioy, Michael Kishinevsky
ICCAD
1997
IEEE
144views Hardware» more  ICCAD 1997»
15 years 1 months ago
Partial scan delay fault testing of asynchronous circuits
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
Michael Kishinevsky, Alex Kondratyev, Luciano Lava...