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131
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DFT
2003
IEEE
120views VLSI» more  DFT 2003»
15 years 9 months ago
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS)
The implementation of imaging arrays for System-On-a-Chip (SOC) is aided by using faulttolerant light sensors. Fault-tolerant redundancy in an Active Pixel Sensor (APS) is obtaine...
Sunjaya Djaja, Glenn H. Chapman, Desmond Y. H. Che...
CORR
2010
Springer
210views Education» more  CORR 2010»
15 years 4 months ago
Test Case Generation for Object-Oriented Imperative Languages in CLP
Testing is a vital part of the software development process. Test Case Generation (TCG) is the process of automatically generating a collection of test-cases which are applied to ...
Miguel Gómez-Zamalloa, Elvira Albert, Germ&...
OSDI
2006
ACM
16 years 4 months ago
CRAMM: Virtual Memory Support for Garbage-Collected Applications
Existing virtual memory systems usually work well with applications written in C and C++, but they do not provide adequate support for garbage-collected applications. The performa...
Ting Yang, Emery D. Berger, Scott F. Kaplan, J. El...
USENIX
2008
15 years 6 months ago
Protection Strategies for Direct Access to Virtualized I/O Devices
Commodity virtual machine monitors forbid direct access to I/O devices by untrusted guest operating systems in order to provide protection and sharing. However, both I/O memory ma...
Paul Willmann, Scott Rixner, Alan L. Cox
117
Voted
FATES
2004
Springer
15 years 9 months ago
Specifying and Generating Test Cases Using Observer Automata
We present a technique for specifying coverage criteria and a method for generating test suites for systems whose behaviours can be described as extended finite state machines (EF...
Johan Blom, Anders Hessel, Bengt Jonsson, Paul Pet...