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VTS
2003
IEEE
88views Hardware» more  VTS 2003»
15 years 6 months ago
Use of Multiple IDDQ Test Metrics for Outlier Identification
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
Sagar S. Sabade, D. M. H. Walker
84
Voted
GECCO
2003
Springer
130views Optimization» more  GECCO 2003»
15 years 6 months ago
Extracting Test Sequences from a Markov Software Usage Model by ACO
The aim of the paper is to investigate methods for deriving a suitable set of test paths for a software system. The design and the possible uses of the software system are modelled...
Karl Doerner, Walter J. Gutjahr
RSP
1998
IEEE
126views Control Systems» more  RSP 1998»
15 years 5 months ago
Testing Prototypes Validity to Enhance Code Reuse
The complexity of distributed systems is a problem when designers want to evaluate their safety and liveness. Often, they are built by integration of existing components with newl...
Didier Buchs, A. Diagne, Fabrice Kordon
DEBU
2008
131views more  DEBU 2008»
15 years 25 days ago
Testing Berkeley DB
Oracle Berkeley DB is a family of database engines that provide high performance, transactional data management on a wide variety of platforms. Berkeley DB products are available ...
Ashok Joshi, Charles Lamb, Carol Sandstrom
92
Voted
ICASSP
2011
IEEE
14 years 4 months ago
Bias analysis of the forced choice detection test for Rayleigh/Rician statistics
For Rayleigh/Rician statistics at the decision device, the probability of correct decision in the forced choice (FC) hypothesis test is given in terms of a closed-form finite ser...
Graham W. Pulford