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DAM
2010
101views more  DAM 2010»
14 years 10 months ago
On the distribution of distances between specified nodes in increasing trees
We study the quantity distance between node j and node n in a random tree of size n for increasing tree families. We give closed formul
Markus Kuba, Alois Panholzer
CONCUR
2009
Springer
15 years 4 months ago
Testing Finitary Probabilistic Processes
Yuxin Deng, Rob J. van Glabbeek, Matthew Hennessy,...
ITC
1999
IEEE
178views Hardware» more  ITC 1999»
15 years 2 months ago
Embedded X86 testing methodology
The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...
Luis Basto, Asif Khan, Pete Hodakievic
VLSID
2007
IEEE
94views VLSI» more  VLSID 2007»
15 years 10 months ago
A Reduced Complexity Algorithm for Minimizing N-Detect Tests
? We give a new recursive rounding linear programming (LP) solution to the problem of N-detect test minimzation. This is a polynomialtime solution that closely approximates the exa...
Kalyana R. Kantipudi, Vishwani D. Agrawal