4670 search results - page 42 / 934 » Testing that distributions are close |
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
1 This paper presents a BIST strategy for testing the NoC interconnect network, and investigates if the strategy is a suitable approach for the task. All switches and links in the ...
MUC
1992
15 years 2 months ago
1992
This paper reports on the results of the adjunct test performed by GE for the MUC-4 evaluation of text processing systems . In this test, we evaluated the effect of an object-orie...
101
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PDP
2003
IEEE
15 years 3 months ago
2003
IEEE
This paper presents a high-level approach for assessing the performance behavior of complex scientific applications running on a high-performance system through simulation. The pr...
AAAI
2008
15 years 9 days ago
2008
Transfer learning addresses the problem of how to utilize plenty of labeled data in a source domain to solve related but different problems in a target domain, even when the train...
DATE
2006
IEEE
15 years 4 months ago
2006
IEEE
Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of faul...